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Scope of delivery
1x P603, RF Current Probe 1 Ohm
1x P750, RF Voltage Probe 150 Ohm
1x CS-ESA, ChipScan-ESA Software / USB
1x SMA-SMB 1 m, SMA-SMB Measuring Cable
1x NT FRI EU, Power Supply Unit
1x P603 / P750 case, System Case
1x P603 / P750 m, P603 / P750 Set User Manual
Short description
The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
The measurements with the probe set guarantee a high precision when repeated and comparability of measurements.
The ICE1 IC test environment of Langer EMV-Technik is used to start the test IC. measurements can be done with ChipScan-ESA software. Measurement results of all measured pins are saved in the software and can be compared fast and systematically.
Datasheet
Manual
