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Input Type: Sensor: Ni-Cr-Ni-Si (K type) thermocouple (T type, J type can be customized)
Test Range:
1. Temperature Range: -100℃~1000℃
2. Measuring Accuracy:
0~1000℃: ± (read value * 0.5% + 1)℃,
-100~0℃: ± (read value * 0.5% + 2)℃
Channel Number: 32
Display: LCD 240*128 dot matrix screen
Single Screen Display: 32 road
U Disk Storage: Yes
Live Test: 300V
Internal Storage: Yes
Alarm Mode: Digital flicker
Anti-Interference: Anti high frequency interference
Communication Interface: RS232
Software Kit: 2000 edition
Permissible Environmental Conditions:
1. Power Supply: AC220V ± 10%, 50Hz ± 2%
2. Use Environment: Work temperature: -20~70℃, relative humidity: 20%-90%
3. The Highest Potential Difference Between Thermocouples: <350V (true effective value)
Outside Size: (L × W × H) 36cm × 26cm × 16cm
Weight: About 5kg
Brief introduction:
JK-XU/XA/XC multi-channel temperature tester equipped with large screen LCD screen . U disk storage interface, easy to display measuring and save the temperature data,It is an instrument suitable for simultaneous real-time monitoring and tracking of multiple points. Use high withstand voltage semiconductor relay as scanning of switching input signal, It realizes high-speed scanning and eliminates the noise and service life problems caused by traditional relays.
Technical characteristics:
It can set the upper and lower limits of the temperature value of each channel, beyond the sound alarm. Large screen liquid crystal display, can also display multiple temperature value with U disk interface, Insert the U disk can save mass temperature record data. Large-screen LCD display can display multiple temperature values at the same time. With U disk interface, access to the U disk can save a large amount of temperature record data. Especially for manufacturers and quality inspection departments in ovens, sterilizers, lamps, household appliances, motors, electric heating appliances, thermostats, transformers, thermal protectors and other industries to detect multi-point temperature fields. The temperature of energy-saving lamps, electronic ballasts, transistors, chokes, magnetic rings, capacitors and other components are monitored on Live Testing in real time at the same time. The entire temperature rise process is recorded by the computer in a curve manner, which is convenient for analysis and improvement. Improving the reliability of energy-saving lamps and electronic ballasts plays a great role.
