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Technical parameters
Frequency range: 200 kHz - 1 GHz
Resolution: 300 µm
Internal diameter: 500 µm
Scope of delivery
1x ICR HV500-75, Near-Field Microprobe 200 kHz - 1 GHz
1x BT 706, Bias Tee for Langer probes
1x SMA-SMA RA, Cable SMA-SMA, right angle
1x ICR-C, ICR Certificate
1x ICR Corr, Correction Curves ICR / USB
1x NT FRI EU, Power Supply Unit
1x ICR case1, System Case
Short description
The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed:
Surface Scan via IC according to IEC 61967-3
Volumenscan via IC
Pin Scan
The measuring electrode at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an E-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
Datasheet
Overview
