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Texas Instruments V62/04730-01XE Specialty Function Logic Mil Enhanced 3.3V AB T Scan Test Device A 595-8V182512IDGGREP

Name: Texas Instruments V62/04730-01XE Specialty Function Logic Mil Enhanced 3.3V AB T Scan Test Device A 595-8V182512IDGGREP
Brand: Texas Instruments

ManufacturerTexas Instruments(View more products from this manufacturer)

ModelV62/04730-01XE

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Function: Scan Test Device with Universal Bus Transceiver

Unit Weight: 262.600 mg

Mounting Style: SMD/SMT

Number of Circuits: 2 Circuit

Supply Voltage - Max: 3.3 V

Propagation Delay Time: 7.7 ns

Maximum Operating Temperature: + 85 C

Minimum Operating Temperature: - 40 C