Electronics Manufacturing

A practical guide to matching EL detector pixel count with photovoltaic module inspection needs, defect visibility requirements, and inspection workflows.

Multimeters can still measure small currents, but only up to a certain limit. When the current drops to the µA or nA range—or lower—the device's resolution, background noise, and stability begin to directly affect the results. This is when a picoammeter or a specialized current-measuring instrument is required

A practical overview of colorimeters, from tristimulus measurement and color difference data to routine quality-control applications.

When colors are inconsistent or differ from the specified requirements, factories may face difficulties maintaining product consistency and a consistent brand image. Factories should clearly define their color control requirements, compare different types of equipment, and conduct practical testing before selecting the right color measurement instrument.

The OWON HDS120 series combines multimeter functions and oscilloscope waveform viewing in one portable instrument for electrical measurement tasks.

The OWON OWH67 series is a high-power programmable DC power supply range designed for laboratory and industrial rack-mounted applications.

The OWON SPS series combines fanless operation, single-channel programmable DC output, constant-power operation, waveform functions, and integrated protection features.

Memory depth determines how many data points an oscilloscope can store during a single acquisition. This parameter directly affects the actual sampling rate, observation time, and the ability to capture and analyze abnormal events.

Equipment restarts in a factory setting can be attributed to voltage sags, momentary power outages, electrical noise, overheating, or hardware faults. For incidents that last only a few power cycles, a power quality analyzer can capture voltage, current, and waveform data at the exact moment of the reset, thereby helping engineers determine whether the power supply is the cause

Record length is the number of data points stored during a single waveform acquisition. When the sampling rate remains constant, a longer record length allows the oscilloscope to capture the signal over a longer period of time. Record length affects the actual sampling rate, the ability to maintain a high sampling rate over an extended period, and the amount of data available for electrical waveform analysis.